LA19-13-02 (3MHz to 3GHz, Dynamic Range 80dB Vector Network Analyzer with Full S-Parameter Measurement)
About Product
The Vector Network Analyzer, VNA, is a form of RF network analyzer widely used for RF design applications. The LA LA19-13-02 Vector Network Analyzer is a PC-driven VNA suitable for measuring a wide range of devices from 3MHz to 3GHz with 100Hz resolution. It’s full S-parameter test set on S11, S22, S21, S12 includes bias-Ts for biasing active devices. It is housed in a small lightweight package making it very portable. The user interface control software provides many useful features including memory function, limit lines, de-embedding, time domain and reference plane extension. Also, utilities such as measurement of power at the 1dB gain compression point and AM to PM conversion factor add to the instrument. Unique features include OSL calibration that does not require a precision load and importing of data files into memory traces for live comparison with measurements. Demo Kit – SOLT is also an essential tool for vector network analyzing and is a must. See Demo Kit – SOLT from photo section.
Product Features
Wide measurement frequency range: 3MHz to 3GHz
Resolution: 100Hz
Dynamic range: 80dB
Full S-parameter test set including S11, S22, S21, S12
De-embedding capability
Time domain facility
P1dB and AM-PM measurements
Light weight and small footprint
Low cost and affordable
Product Functions
Easy to follow user interface based on familiar Windows® form (See photo section)
Wide selection of sweep points: From 51 to 1024 with 100Hz resolution. -20dBm to 0dBm test level
Measurements can be saved in several formats to support most simulators
Low trace noise: Typically 0.001dBrms
Calibration and status can be easily saved and recalled
Multiple markers including delta, fixed, peak/min find modes provide precise readouts. Drag any marker using the mouse or dial in a precise frequency
4 display channels/2 traces per channel allow all S-parameters to be displayed
Limit lines are easy to setup and support up to 4 segments
User-defined color scheme for the graphics display to suit individual preferences
Memory facility includes vector math functions
Time domain facility can be used for fault finding
Measurement enhancement includes averaging, smoothing, reference plane extension and de-embedding. The latter is particularly useful when evaluating devices mounted on test jigs, requiring interfacing networks to be removed from the measurements (See photo section)
Easy calibration using low cost calibration kit (See photo section)
By using the calibration data provided with each economy calibration kit, the need for an expensive precision load is removed without loss of accuracy
Setting up the calibration is easy and can be completed in very little time
Utilities provided include power at the 1dB gain compression point and AM to PM conversion. These help to characterize active devices such as amplifiers easily. In addition to these, a further utility allows the instrument to be configured as a simple synthesized signal source (See photo section)
Product Application
RF design applications
RF performance of radio frequency (RF) and microwave devices to be characterized in terms of network scattering parameters, or S parameters such as S11, S22, S21, S12
