LA19-13-03 (300kHz to 8GHz, Dynamic Range 120dB Vector Network Analyzer with Full S-Parameter Measurement)
About Product
The Vector Network Analyzer, VNA, is a form of RF network analyzer widely used for RF design applications. The LA LA19-13-03 Vector Network Analyzer is a PC-driven VNA suitable for measuring a wide range of devices from 0.3MHz to 8GHz. In addition to internal bias-Ts for biasing active devices, the internal couplers can be bypassed to test, for example, high power devices. The instrument is housed in a small, lightweight package making it very portable. The control software provides a wide range of features including memory functions, limit lines, de-embedding, time domain and reference plane extension. Utilities such as a comprehensive signal generator, measurement of power at the 1dB gain compression point with frequency and AM to PM conversion factor add versatility to the instrument. Demo Kit – SOLT is also an essential tool for vector network analyzing and is a must. See Demo Kit – SOLT from photo section.
Product Features
Wide measurement frequency range: 300kHz to 8GHz
Dynamic range: 120dB
Sweep time: 200µs
Full S-parameter test set including S11, S22, S21, S12
P1dB and AM-PM measurements
Signal Generator mode
Small footprint
Flexible architecture and outstanding value
Product Functions
Easy to follow user interface based on familiar Windows® form (See photo section)
Wide selection of sweep points: From 51 to 9001 with 10Hz resolution. -20dBm to +10dBm test level
Measurements can be saved in several formats to support most simulators
Low trace noise: Typically 0.001dBrms
Calibration and status can be easily saved and recalled
Multiple markers including delta, fixed, peak/min find modes provide precise readouts. Drag any marker using the mouse or dial in a precise frequency
4 display channels/2 traces per channel allow all S-parameters to be displayed
Limit lines are easy to setup and support up to 8 segments
User-defined color scheme for the graphics display to suit individual preferences
Memory facility includes vector math functions
Time domain facility can be used for fault finding
Measurement enhancement includes averaging, smoothing, reference plane extension and de-embedding. The latter is particularly useful when evaluating devices mounted on test jigs, requiring interfacing networks to be removed from the measurements (See photo section)
Wide dynamic range covers many applications (See photo section)
Fast sweep as sweep times down to 200µs per point for single parameter measurements and 600µs for full error correction. At 20kHz bandwidth, full band sweep times are: 28ms for 51 points & 12-terms correction, 108ms for 201 points & 12-terms correction and 19ms for 101 points & S21 calibration
Accurate calibration with optional 3.5mm Calibration Kit
Each Calibration Kit is provided with the calibration data that closely characterizes the Load. Using this data significantly enhances the performance of the Calibration Kit (See photo section)
Easy to use calibration kit editor (See photo section)
Utilities provided include power at the 1dB gain compression point and AM to PM conversion. The LA19-13-03 can be configured as a synthesized signal source with a comprehensive range of facilities as shown overleaf (See photo section)
Comprehensive signal generator functionality (See photo section)
Signal generator function from 300kHz to 8GHz with the ability to set the amplitude from -20dBm to +10dBm and phase
Sweep generator function allows frequency sweep plans of up to 9001 points with dwell time settable from 26µs to 65500µs. Amplitude level sweep is also supported over a range of +10dBm to -20dBm. Both types of sweep modes can be synchronized to an external trigger
FM and AM modulation modes at 1kHz or 400Hz with up to 200kHz FM deviation and up to 90% AM modulation depth
Hop modes support frequency, phase and level hopping. In all cases dwell times can be set between 26µs and 65500µs
Flexible architecture for testing a power device (See photo section)
Product Application
RF design applications
RF performance of radio frequency (RF) and microwave devices to be characterized in terms of network scattering parameters, or S parameters such as S11, S22, S21, S12
