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Lock-in amplifiers that
measure extremely small alternating signals hidden deep within noise are used
in a wide range of advanced research fields, including scanning probe
microscopes, terahertz spectroscopy and spintronics. |
Frequency range |
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Voltage measurement |
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Current measurement 10 fA to 1 μA F.S. (except for LI5645) |
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Minimum time constant |
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Dynamic reserve 100 dB or more |
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Analog output update
rate |
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Dual Frequency
Simultaneous measurement (LI5660/LI5655/LI5650) |
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Fractional Harmonic
measurement |
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External 10 MHz
synchronous input |
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Measurement parameters: X, Y, R, θ, DC, Noise |
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Interfaces: USB, GPIB, LAN |
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Thin 2U size (88 mm) |
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Time Constant |
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The minimum time
constant is 1 μs for LI5660/LI5655 (5 μs for LI5650/LI5645). |
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Synchronous Filter |
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This is an integer-period moving-average filter. Ripple caused by detection is greatly reduced, and the output is nearly settled in the averaging interval (integer period), so the time constant can be reduced (to obtain faster response) |
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High-speed Locking Even at Low Frequencies |
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It takes just about two cycles to lock on to the reference signal even at low frequencies. Furthermore, a moving average filter synchronized with the signal cycle obtains a high-speed response with a small ripple. |
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Outstanding Dynamic Reserve |
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Phase detection and subsequent processing are performed digitally. Output zero drift at high gains is smaller than the analog system, and up to 100 dB dynamic reserve can be obtained (measurement can be performed with a noise 100,000 times larger than the sensitivity, namely the signal full scale). |
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Voltage measurements can be made with a single end (A) or differential (A-B) input, as well as 10 Vrms input (C) and high-frequency input (HF) terminals with the LI5660. The HF input terminals can be used to measure up to 11 MHz. |
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Measurements can be
made at submultiple frequencies of the fundamental wave (1 to 63) / (1 to
63). |
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Harmonic measurements are made at integral multiples between two measurement frequencies (f2 = (f1 x n) ). In this case, distortion in thef1 side signal results in an integral multiple frequency (harmonic), which cannot be distinguished from the f2 signal. With subharmonic measurements, measurements can be conducted with the f2 = f1 x n/m relationship, which means that even if distorted harmonics are generated with f1, the frequency can be set so that it does not affect f2. f2 harmonic measurements are possible without being affected by f1 harmonics. |
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LI5660/LI5655/LI5650
come with 2-phase sensitive detectors (PSD), allowing simultaneous
measurement of two frequency components that are included in a single input
signal. Measurements that previously required two lock-in amplifiers using
the dual beam method can now be made with a single lock-in amplifier. |
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*The detection mode of LI5645 is "SINGLE" mode only. |
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High Speed Sampling of Analog Data The digital data of output is sampled at high speed and converted to an analog signal.
It is useful to detect peak signals when measuring by differential calculus such as Auger electron spectroscopy. |
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Digital Data Buffer Function If the number of data
points is large in high-speed measurement, it may not be possible to transfer
all data due to the communication speed of the interface. |
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Synchronizing operation of other devices such as a signal generator and the LI5600 series using a 10 MHz frequency source allows synchronization to any frequency (can be configured) without having to use an external reference signal (REF IN). |
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LI5660 |
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