NF AC Power Source - Programmable AC/DC Power Source ES series IEC 61000-4

AC Power Source - Programmable AC/DC Power Source ES series

From EMC tests and various simulations to CVCF for anechoic chamber.

ES series is a multifunction programmable AC/DC power source you can use in EMC tests such as low frequency immunity test and harmonic current measurement, in tests with various power sources, and furthermore, as CVCF for anechoic chamber. Both AC and DC outputs are available and enriching various functions such as measurement functions and sudden change and sweep functions are equipped. In addition, the latest testing software (ES0406B, option) is available to facilitate low frequency immunity test. This series is available in two styles; Component style that can expand with addition of a booster, and Cabinet style that is simple and requires small installation space. You can choose the best style for your application and use conditions. With ES Series, It's Easy to Conduct Various Specification Tests and Simulations.

	*Single-phase 2 kVA to 20 kVA, Three-phase 6 kVA to 60 kVA. Single-/Three-phase switchable.**
	AC output voltage: 0 to 150 V/0 to 300 V, Frequency: 5 Hz to 1100 Hz, DC output voltage: 0 to + 203 V/0 to + 406 V
	Component style allows expansion after being introduced. Cabinet style is compact and requires small installation space.
	Voltage dips, voltage variations, simultaneous sweeping of frequency and voltage.
	*Equipped with measurement function, protective circuit, remote sensing, and AGC function. External input available and peak current of 3.5 times of maximum rms value can be supplied.**
	*Software (ES0406B) that performs low frequency immunity test of IEC standard is available.**
	Performs power source harmonic measurement, SEMI F42/F47 specification tests, and various simulations. Furthermore, it can be used as CVCF for anechoic chamber or production line.

Enriching Lineup in Two Styles to Choose from

Same functions and performance are provided in two styles.

ES series is available in two styles; Component style that is capacity-expandable with addition of a booster, and Cabinet style that is simple and requires small installation space. You can choose the one that suits your situation from our rich lineup.

	Component Style	Cabinet Style (S or L type)
Single-Phase Systems	2 kVA to 20 kVA (Increment of 2 kVA) Basic : ES2000S Single-phase master (2 kVA) ES2000B Booster (2 kVA) added	6 kVA to18 kVA (5 types) 6 kVA (ES6000S) S type x 1 8 kVA (ES8000S) S type x 1 10 kVA (ES10000S) L type x 1 12 kVA (E12000S) L type x 1 18 kVA (ES18000S) S type x 1 + L type x 1
Three-Phase Systems	6 kVA to 60 kVA (Increment of 6 kVA) Basic : Combination of one unit of ES2000U Three-phase master (2 kVA) and 2 units of ES2000P Three-phase slave (2 kVA). Total of 6 kVA. 3 units of booster (2 kVA, ES2000B ) are added as output power increases	24 kVA, 36 kVA 24 kVA (ES24000T) S type x 1 36 kVA (ES36000T) L type x 1
Three-/ Single Phase Systems	Three-phase 6kVA system equipped with optional distribution unit	6 kVA, 12 kVA, 18 kVA 6 kVA (ES6000W) S type x 1 12 kVA (ES12000W) L type x 1 18 kVA (ES18000W) S type x 1+L type x 1

Low Frequency Immunity Test

Standard Name	Test Name
IEC 61000-4-11 (2004)*¹	Voltage dips, short interruptions, voltage variations
IEC 61000-4-13 (2002)	Harmonics combination (Flat curve)
	Harmonics combination (Overswing)
	Sweep in frequency
	Individual harmonics
	Interharmonics
	Meister curve
IEC 61000-4-14 (2002)	Voltage fluctuation
IEC 61000-4-27*² (2000)	Unbalance
IEC 61000-4-28 (2002)	Variation of power frequency
IEC 61000-4-29*²(2000)	Voltage dips, short interruptions, voltage variations on d.c. input power port
Other tests	Abrupt voltage and/or phase change
	Phase unbalance in single-phase three-wire systems and three-phase systems
	Arbitrary waveforms

*1 : As-517A (our Voltage Dips Simulator) is required.

*2 : Preliminary tests can be conducted with ES0406B.

Low Frequency Immunity Test Program ES0406B
(Option)

This is application software for ES series to perform low frequency immunity tests. With this software, complicated tests can be conducted easily.

	Remote control function allows you to set voltage/frequency, switch range, and turn on/off output.	menu
	Arbitrary waveforms can be edited/created. The waveform data retrieved from digital oscilloscopes can be loaded as a text file.
	The test result report creating function allows you to output the results of tests into a file.

^*	You need interface ES4473 (option) for using this software.
^**	Peripheral cables and parts other than ES series, ES0406B, and PC may be needed, depending on the specification test. Contact us for details.

HARDWARE REQUIREMENTS

PC:PC/AT compatible
CPU : 300 MHz or faster
Memory : 128 MB or more OS : Windows 98SE/Me/2000/XP (Microsoft)

GPIB Interface (Use one of the followings)
PCI-GPIB board, PCMCIA-GPIB card, USB-GPIB (All by National Instruments)

IEC 61000-4-11

IEC 61000-4-14

Remote controller

Other Specifications Tests

Standard Name	Test Name
SEMI F42/F47	Semiconductor processing equipment voltage sag immunity
IEC 61000-3-2 (2005)	Harmonic current emissions(≤16A)
IEC 61000-3-3 (2005)	Voltage changes, Voltage fluctuations, Flicker (≤16A)
IEC 61000-3-11 (2000)	Voltage changes, Voltage fluctuations, Flicker (≤75A)
IEC 61000-3-12 (2004)	Harmonic current emissions(16A to 75A)

*Ask us for testing systems for above standards.

•JIS standard test •UL standard test •JEIDA standard test •JASO standard test •Lloyd's standard test •RTCA standard test •Tests on system interconnection protection system of small photovoltaic cell power generation systems •Various in-house tests

ES Series Handles Broad-Ranging Applications

	For IEC 61000-4-11
	Voltage Dips, Short Interruptions, and Voltage Variations Tests

	For IEC 61000-3-2/IEC 61000-3-3
	Harmonic Current Measurement and Flicker Measurement

	* Reference impedance network is not required in the standard IEC 61000-3-2.

	For SEMI F42/F47 (Voltage Sag Immunity) Standard
	Semiconductor Processing Equipment Voltage Sag Immunity Test

	As-520 (sold separately) is used. This is voltage sag(dips)test required for units used at semiconductor factories. Judgement is made with the ride-through performance curve on the screen. For three-phase units, sag is generated at line voltage or phase voltage of one phase.

	Simulation with Arbitrary Waveforms
	Simulation with Arbitrary Waveforms

	Arbitrary waveforms can be created with ES 0406B. Waveform data retrieved from digital oscilloscopes can be also loaded as a text file. For example, the power source waveform given at the site can be reproduced for investigating the causes of malfunctions of the device.

	Others
		For node connection tests in photovoltaic power generation systems
		As CVCF for anechoic chambers and for production lines
		For conversion into voltage and frequency suitable for the destination of export
		For inverter- and motor-related tests
		As power source for testing devices in aircraft

ES2000S
2 kVA Single Phase Master

ES2000B
2 kVA Booster

ES2000U
2 kVA Three Phase Master

ES2000P
2 kVA Three Phase Slave

Cabinet
(S type / L type)

(S type)

System Lineup

• Single Phase

		2kVA	4kVA	6kVA	8kVA	10kVA	12kVA	14kVA	16kVA	18kVA	20kVA
Component Style	ES 2000S	1	1	1	1	1	1	1	1	1	1
	ES 2000U	–	–	–	–	–	–	–	–	–	–
	ES 2000P	–	–	–	–	–	–	–	–	–	–
	ES 2000B	–	1	2	3	4	5	6	7	8	9
Cabinet Style	Model	–		ES 6000S	ES 8000S	ES 10000S	ES1 2000S	–		ES 18000S	–
	S type			1	1	–	–			1
	L type			–	–	1	1			1

• Three-/ Single Phase Switching

		6kVA *	12kVA	18kVA
Component Style	ES2000S	–	---
	ES2000U	1
	ES2000P	2
	ES2000B	–
Cabinet Style	Model	ES6000W	ES12000W	ES18000W
	S type Cabinet	1	–	–
	L type Cabinet	–	1	1

* ES4439 required for component style products

• Three Phase

		12kVA	18kVA	24kVA	30kVA	36kVA	42kVA	48kVA	54kVA	60kVA
Component Style	ES 2000S	–	–	–	–	–	–	–	–	–
	ES 2000U	1	1	1	1	1	1	1	1	1
	ES 2000P	2	2	2	2	2	2	2	2	2
	ES 2000B	3	6	9	12	15	18	21	24	27
Cabinet Style	Model	–		ES 24000T	–	ES 36000T	–
	S type			3		–
	L type			–		3

Component Style (ES 2000S/ES 2000B/ES 2000U/ES 2000P)

S type Cabinet	L type Cabinet

570(W) x 1480(H) x 900(D)	790(W) x 1480(H) x 900(D)

Options

ES4439
Distribution Unit

For three-phase 6 kVA systems in component style

ES4493
External Signal Input

Option to be mentioned when placing an order.
3 sets required for three-phase systems.

ES0406B
Low Frequency Immunity Test Program

ES4473
Interface Board

Equipped with GPIB and RS-232.
VCA inputs and addition inputs available.

ES4474
Remote Terminal

Requires ES 4473

4481 (for 6kVA)
Power Inlet Unit

Distributes single phase 200V among maximum of 3 component-style systems.

4482 (for 6kVA)
Outlet Unit

Equipped with GPIB and RS-232.
VCA inputs and addition inputs available.

Peripheral Equipment

Model	Model Name	Remarks
ES4152	Reference Impedance Network	Requires single phase, 20 A rms, and ES4473
ES4153	Reference Impedance Network	Requires three-/single-phase, 20 A rms (for each phase), and ES4473
As-517A	Voltage Dips Simulator	Requires ES0406B and ES4473
As-520	SEMI F47 Voltage Sag Test Program	Requires ES4473 and PC with GPIB I/F

Reference Impedance Network

For Measuring Harmonic Current and Flicker (IEC 61000-3-3)

This is a circuit network of resistance and inductance to make the output impedance of AC power source come near the impedance of actual commercial line.
Use this in combination with Programmable AC/DC Power Source ES series in harmonic current measurement or flicker test.

	The impedance value is guaranteed at the value given by the combination of ES series and this unit.
	The errors caused by impedance switching relays or current detecting resistor are corrected with feedback.
	Equipped with voltage/current monitoring terminal for connecting analyzer

Model	Description
ES4152	Single phase 2 wires
ES4153	Single phase 2 wires /3 wires, Three phase 3 wires/ 4 wires

Standard Name	Test Name
IEC 61000-4-11 (1994) + A1 (2000) / IEC 61000-4-11 (2004) *¹	Voltage dips, short interruptions, voltage variations
IEC 61000-4-13 (2002) / IEC 61000-4-13 (2009)	Harmonics combination (Flat curve)
	Harmonics combination (Overswing)
	Sweep in frequency *²
	Individual harmonics *²
	Interharmonics *²
	Meister curve *²
IEC 61000-4-14 (1999) + A1 (2001) + A2 (2009)	Voltage fluctuation
IEC 61000-4-27 (2000) + A1 (2009) *³	Unbalance
IEC 61000-4-28 (1999) + A1 (2001) + A2 (2009)	Variation of power frequency
IEC 61000-4-29 (2000) *³	Voltage dips, short interruptions, voltage variations on d.c. input power port
Other tests	Abrupt voltage and/or phase change
	Phase unbalance in single-phase three-wire systems and three-phase systems
	Arbitrary waveforms